报告题目(中文)：电子探测器及在4D-STEM（扫描透射电子显微镜）上的应用
报告题目(英文)：Electron detectors and 4D STEM applications
报告内容简介：

The first part of the presentation will offer a brief summary of electron detector technologies and outline their respective strengths and weaknesses. There will be a detailed description of the hybrid pixel technology, specifically exploring the thresholding and counting concept. The second part of the presentation focuses on the practical utilization of a state-of-the-art hybrid pixel 4D STEM detector. Results are presented for various 4D STEM techniques, including virtual detectors, center-of-mass analysis, ptychography and orientation mapping.

报告人姓名：Dr. Matthias Meffert
报告人简介(中文)：Dr. Matthias Meffert got his PhD in Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Germany, where he did research on mixed ionic–electronic conducting materials using transmission electron microscopy. He is now working in Dectris Ltd., Switzerland. Dectris is a world-leading company producing high-performance X-ray and electron detectors to enable new scientific achievements. As a product manager Dr. Matthias Meffert is responsible for the technical aspects during the product lifecycle of electron microscopy products.
报告人简介(英文)：Dr. Matthias Meffert got his PhD in Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Germany, where he did research on mixed ionic–electronic conducting materials using transmission electron microscopy. He is now working in Dectris Ltd., Switzerland. Dectris is a world-leading company producing high-performance X-ray and electron detectors to enable new scientific achievements. As a product manager Dr. Matthias Meffert is responsible for the technical aspects during the product lifecycle of electron microscopy products.
报告人单位(中文)：Dectris Ltd., Switzerland
报告人单位(英文)：
报告时间：2023-09-26 09:30
报告地点：东区16#526室
主办单位：上海大学
备注：
联系人：操光辉